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Veeco Instruments Inc. (ticker: VECO, exchange: NASDAQ Global Market (.O)) News Release - 22-Feb-2006

Veeco Announces The 4th Annual International Nanoscience Conference

VEECO ANNOUNCES THE 4th ANNUAL INTERNATIONAL NANOSCIENCE CONFERENCE CALL FOR PAPERS IN PROGRESS

 

Woodbury, NY February 22, 2006 - Veeco Instruments Inc. (Nasdaq: VECO) announced today that it will host the "Seeing at the Nanoscale IV" conference being held at the University of Pennsylvania, Philadelphia from July 17-20, 2006. The conference, now in its fourth year, provides an optimum forum for scientists to share information on a wide variety of cutting-edge nanotechnology topics. Paul Hansma from the University of California, Santa Barbara will be this year's keynote speaker. Abstracts for papers and posters presentations are now being accepted. Abstract and conference registration details are available at http://nanoconference.veeco.com.

The theme of the three-day symposium is "Exploring Nanostructure Imaging, Characterization and Modification using Scanning Probe Microscopy and Related Techniques." Several hundred international researchers and scientists have attended the prior years' events.

Don Kania, Ph.D., Veeco's President and Chief Operating Officer, commented, "In our fourth year, we are moving the conference to University of Pennsylvania, a key center of nano-research. We expect 'Seeing at the Nanoscale
IV' to continue to be a premier international scientific forum for those involved in nanoscience from both academia and industry. Nanostructural imaging, characterization, and modification utilizing scanning probe microscopy is revolutionizing scientific research. This conference is a tremendous opportunity for scientists worldwide to discuss their latest discoveries."

Session topics for "Seeing at the Nanoscale IV" will be as follows:
Session 1: Nanomechanical & Local Property Measurements/ Chair: Greg Meyers, Dow Chemical Company. Guest Speaker: Ozgur Sahin, Harvard University
Session 2: Biomolecules and Biological Processes/ Chair: Jan Hoh, Johns Hopkins School of Medicine. Guest Speaker: Alexander Malkin, Lawrence Livermore National Labs
Session 3: Visualization II: Materials and Polymer System/ Chair: Sergei Magonov, Veeco Instruments. Guest Speaker Dimitri Ivanov, Institut de Chimie des Surfaces et Interfaces, France
Session 4: Measurements of Electrical, Optical, Magnetic and Thermal Properties of Materials at the Nanoscale/ Chair: Sergei Kalinin, Oak Ridge National Laboratory. Guest Speaker Louis Brus, Columbia University
Session 5: Instrumentation: New Tools and Techniques for Nanoscience/ Chair: Ning Xi, Michigan State University. Guest Speaker Levent Degertekin, Georgia Tech

 

About Veeco

Veeco Instruments, Inc. designs, manufactures, markets and services enabling solutions for customers in the HB-LED, solar, data storage, semiconductor, scientific research and industrial markets. We have leading technology positions in our three businesses: LED & Solar Process Equipment, Data Storage Process Equipment, and Metrology Instruments. Veeco's product development, marketing, engineering and manufacturing facilities are located in New York, New Jersey, California, Colorado, Arizona, Massachusetts and Minnesota. Global sales and service offices are located throughout the U.S., Europe, Japan and Asia Pacific. http://www.veeco.com

 

To the extent that this news release discusses expectations or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the risks discussed in the Business Description and Management's Discussion and Analysis sections of Veeco's Annual Report on Form 10-K for the year ended December 31, 2009 and in our subsequent quarterly reports on Form 10-Q, current reports on Form 8-K and press releases. Veeco does not undertake any obligation to update any forward-looking statements to reflect future events or circumstances after the date of such statements.